Whole-field displacement and strain measurements: application to biomechanics

Benjie Ovryn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

There are a plethora of interference techniques which can be utilized for whole-field displacement and strain measurements. This paper contains a brief overview of some of the whole-field interference techniques which can be used for measurements in biomechanics. Rather than provide an exhaustive review of the applications of these techniques in biomechanics, however, two specific applications using holographic interferometry (HI) are presented. Although focused on HI, this discussion is pertinent to a range of whole-field interference techniques. The term whole-field is used to differentiate a class of interference techniques which provide information about displacement and strain over a large field of view, from point-by-point methods which require the repetition of the experimental protocol at an ensemble of points to produce similar information. Strain gauge measurements are a prime example of the latter class of techniques. Although whole-field methods often require an analysis at discrete points, the simultaneous acquisition of information at an ensemble of points is characteristic of these techniques.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsHalina Podbielska, Abraham Katzir
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages134-148
Number of pages15
ISBN (Print)0819411167
StatePublished - 1993
Externally publishedYes
EventHolography, Interferometry, and Optical Pattern Recognition in Biomedicine III - Los Angeles, CA, USA
Duration: Jan 17 1993Jan 19 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1889
ISSN (Print)0277-786X

Other

OtherHolography, Interferometry, and Optical Pattern Recognition in Biomedicine III
CityLos Angeles, CA, USA
Period1/17/931/19/93

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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