Abstract
A new image processing technique has been developed which uses an operational eigenvector associated with the null eigenvalue (e.i.o) together with supplementary information to limit non-uniqueness associated with standard methods. A field of e.i.o. corrections is iteratively imposed to minimize the test function(s) reflecting solution agreement with the supplementary information. Computer simulation with supplementary information consisting solely of the global source field strength second moment value results in dramatic improvement over standard methods.
Original language | English (US) |
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Pages (from-to) | 264-272 |
Number of pages | 9 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 1153 |
DOIs | |
State | Published - Jan 30 1990 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering