Abstract
The Lenth method is an objective method for testing effects from unreplicated factorial designs and eliminates the subjectivity in using a half-normal plot. The Lenth statistics are computed for the factorial effects and compared to corresponding critical values. Since the distribution of the Lenth statistics is not mathematically tractable, we propose a simple simulation method to estimate the critical values. Confidence intervals for the estimated critical values can also easily be obtained. Tables of critical values are provided for a large number of designs, and their use is demonstrated with data from three experiments. The proposed method can also be adapted to estimate critical values for other methods.
Original language | English (US) |
---|---|
Pages (from-to) | 57-66 |
Number of pages | 10 |
Journal | Journal of Quality Technology |
Volume | 32 |
Issue number | 1 |
DOIs | |
State | Published - Jan 1 2000 |
Externally published | Yes |
Keywords
- Confidence intervals
- Experimentwise error rate
- Factorial designs
- Fractional factorial designs
- Individual error rate
- Mixed-level designs
- Plackett-burman designs
- Simulation
ASJC Scopus subject areas
- Safety, Risk, Reliability and Quality
- Strategy and Management
- Management Science and Operations Research
- Industrial and Manufacturing Engineering